SAN JOSE, Calif., Oct 19, 2005-- SynTest Technologies, Inc., a leading supplier of Design-for-Test (DFT) tools, was granted 33 claims on Oct. 11, 2005 under United States Patent # 6,954,887 for its ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

Conducting product testing on printed circuit boards (PCBs) has the potential to become costly. Because of this, it’s easy for businesses to view PCB assembly testing as an expense without much value.

For example, scan tests tend to run circuits in nonstandard modes, and scan shifting causes maximum power dissipation for short periods. Such high power dissipation during production test can stress ...

As IC geometries shrink, the large, consolidated memory blocks within ICs are giving way to tens or even hundreds of smaller memory arrays distributed throughout each chip. These arrays serve as ...