Electronic Design

Next-Generation RF Device Test Performance Challenges

This is the second article of a three-part series discussing the likely impacts of next-generation consumer wireless semiconductor devices on instrumentation performance requirements. The first ...
EDN

Agilent’s go/no-go tester streamlines mobile device testing

The N9360A mobile station tester from Agilent Technologies is a stand-alone one-box test set for mobile device testing in service and repair, manufacturing, and R&D applications. According to the ...
EDN

Tips & Tricks: NIB–An enhanced environment for mobile device test

Fixed-mobile convergence (FMC) and emerging protocols are changing the landscape for mobile developers. They impact the feature sets and performance of BSC and BTS equipment to over-the-air ...
Electronic Design

Special Report: Medical test challenges extend from simulation to compliance

Wearable, mobile, implantable, and home health devices as well as electronic components, circuit boards, and subassemblies incorporated into medical equipment used in clinical settings all present ...
Semiconductor Engineering

Challenges And Outlook Of ATE Testing For 2nm SoCs

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...
Business Wire

Mobile Labs and SOASTA Partner For Enterprise Mobile Testing

ATLANTA--(BUSINESS WIRE)--Mobile Labs, LLC, a leading provider of enterprise-grade, next generation mobile testing solutions, today announced a partnership with SOASTA, a leader in cloud and mobile ...