AZOM

Using a Plasma FIB-SEM for Extra Large Area Cross-Section in an OLED Display

Organic light emitting diodes (OLEDs) — a flat light emitting technology — comprise of a series of organic thin films arranged between two conductors. They emit bright light when an electrical current ...
Toronto Star

New ZEISS Crossbeam 750 FIB-SEM for high-accuracy sample preparation workflows

New ZEISS Gemini 4 electron optics offer superior resolution and signal-to-noise ratio Live SEM imaging extended to monitor rapid FIB milling down to ultrafine lamella polishing Largest undistorted ...
AOL

SEM-Guided Low-kV FIB Finishing for Leading-Edge Semiconductor Failure Analysis

Discover how the ZEISS Crossbeam 750 FIBSEM sets a new benchmark for precise TEM lamella prep, tomography, and advanced nanofabrication. This delivers better resolution, better SNR, larger usable FOV, ...
AZOM

Plasma FIB-SEM platform for deep sectioning - TESCAN SOLARIS X

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
AZoNano

Using Advanced FIB-SEM Tomography to Characterize Solid Oxide Electrolysis Cells

Solid oxide electrolysis cells (SOEC) show great promise as an alternative to batteries for storing excess renewable energy as they achieve almost 100% electrical-to-H 2 efficiency. In the SOEC, ...