San Jose, Calif. — Magma Design Automation Inc. has launched the Talus automatic test pattern generation (ATPG) and Talus ATPG-X products with on-chip compression. These advanced ATPG products are ...
Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on integrated circuits continues to double ...
Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
As IC design sizes continue to double every 18 to 24 months, those charged with testing the finished product are challenged on multiple fronts. Test-data volume and testing time are expanding, while ...
A convergence of DFT techniques and the proliferation of in-silicon monitors can flag potential failures before they occur.
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